The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 1987
Filed:
Jan. 15, 1985
Ralph M Grant, Rochester, MI (US);
Other;
Abstract
For purposes of eye examination, a method is provided for determining the presence or absence of structural anomaly in the retina. In this method, the surface of the retina (under zero stress or any one of a selected variety of stress conditions to produce deformation) is illuminated with coherent light and separate exposures or interferograms are made using the reflected light and recorded either photographically or electronically such as by storage or display via the cathode of a television image tube. The exposure may either be holographic, in which case the interferogram is produced by using a reference beam of light derived from the same source that illuminates the object surface, or shearographic, in which case two focused images of the retinal surface section are formed on a photosensitive medium, displaced with respect to one another and overlapping one another. The resultant hologram or shearogram is processed in conventional manner to derive an image of the object surface containing fringes arrayed as a function of the deformation of the surface between the several exposures. These fringes are analyzed to detect anomalous fringe families related to deformation that signifies structural anomaly in the retina.