The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 1987
Filed:
Jan. 16, 1984
Rene Keller, Wettswil, CH;
Emhart Industries, Inc., Farmington, CT (US);
Abstract
The inspection apparatus comprises scanning means and processing means operative to produce a lean signal which indicates how much an article moving on a conveyor leans from the vertical. Comparing means is operative to compare the lean signal with a first preselected standard and a second preselected standard which is lower than the first preselected standard. If the first standard is exceeded, the article is rejected by first rejecting means and, if the second standard is exceeded the article may be rejected by second rejecting means downstream of the first after further information has been obtained about the article from inspection devices, or the second standard may be used to provide an indication of a trend towards leaning.