The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 1987
Filed:
Apr. 12, 1985
Applicant:
Inventor:
Edward M Browne, Houston, TX (US);
Assignee:
ESM International, Inc., Houston, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356447 ;
Abstract
An apparatus for measuring the reflectivity of a product for use in optical sorting machines that is tolerant of background and product trajectory variations. The apparatus computes the percent of the viewing frame filled by the product at any instant as well as the reflectivity of the background when no product is present. The reflectivity at selected wavelengths from selected perspectives is computed for a product as the product passes a viewing frame by correcting for frame fill and background factors. Given an estimate of product velocity, product size may also be estimated.