The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 1987

Filed:

Dec. 27, 1984
Applicant:
Inventors:

Peter Neukomm, Wettingen, CH;

Viktor Augustin, Friedlisberg, CH;

Assignee:

Haenni & Cie AG, Jegenstorf, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356376 ; 356-1 ;
Abstract

The optical measuring instrument emits a coherent beam of radiation normally to a surface of an object. The scattered radiation generated by the beam of radiation is guided through an optical device to a stationary strip-shaped linear radiation sensor element. The linear radiation sensor element is arranged within a hollow cylinder which is rotatable in an operative position thereof. The hollow cylinder contains a multiple number of slots which traverse the strip-shaped linear radiation sensor element at an acute angle. An evaluation circuit arrangement is connected to the linear radiation sensor element and only generates evaluatable measuring signals during the traversal of one of the slots over a location at the linear radiation sensor element where there occurs a radiation intensity exceeding a predetermined threshold value. Using such measuring instrument it is possible to measure distances with high resolution.


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