The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 1987
Filed:
Nov. 26, 1984
Applicant:
Inventors:
Katsuhiko Kitaya, Tokyo, JP;
Nagayoshi Ichise, Fukui, JP;
Assignee:
Nippon Sheet Glass Co., Ltd., , JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356239 ; 250563 ; 250572 ; 358406 ;
Abstract
In a distortion inspection apparatus of a glass plate, a light and dark contrast pattern is sensed by an image sensor through a glass plate. The number of bits corresponding to a light or dark portion is detected from bipolar image data which are divided into a plurality of bits along each of parallel scanning lines assumed upon a surface of the glass plate. Then, a distortion state of the surface of the glass plate is discriminated in accordance with the differences among the thus detected number of bits and a reference value thereof. In such an arrangement, quantitative distortion discrimination can be performed.