The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 1987

Filed:

Feb. 19, 1985
Applicant:
Inventors:

Tadashi Fujii, Fujinomiya, JP;

Yoshizo Ishizuka, Fuji, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
128660 ; 73599 ;
Abstract

In a method and apparatus for ultrasonic measurement, an ultrasonic pulse is transmitted into a object and received as an echo signal following reflection within the object, and the acoustic characteristic of the object is measured based on object position and frequency information contained in the echo signal. The measured acoustic characteristic is representative of information relating to degree of attenuation and frequency dependence thereof inside the object and obtained from the position and frequency information contained in the echo signal. The apparatus according to this invention displays an image of the distribution of the object acoustic characteristic obtained from the measured acoustic characteristic.


Find Patent Forward Citations

Fujii, Tadashi. (1987). Ultrasonic measurement method, and apparatus therefor (U.S. Patent No. 4646748). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4646748

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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