The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 1987
Filed:
Dec. 10, 1984
Hirokazu Suzuki, Yamato, JP;
Takehiro Akiyama, Kawasaki, JP;
Teruo Morita, Kawasaki, JP;
Hirofumi Takeda, Yokohama, JP;
Hikotaro Masunaga, Tokyo, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A gate circuit device of an integrated circuit tester, for variably setting the signal propagation delay time of various integrated circuits to be tested at a predetermined value, includes a gate circuit having a pair of emitter coupled transistors and a constant current source transistor connected to the emitter side of the pair of transistors, and a terminal to apply a predetermined level of voltage to the base of the constant current source transistor to control the constant current. In addition to this manner of the voltage control of signal propagation delay time, a current adjustment circuit is utilized to generate current in a constant current source transistor in response to the control current. Thus, the gate circuit device controls the signal propagation delay time by regulating either voltage or current in response to the control current.