The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 1987

Filed:

Feb. 29, 1984
Applicant:
Inventor:

Walter Schmitt, Traunreut, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
2502 / ; 3312 / ;
Abstract

A measuring system includes reference marks provided in the measuring direction alongside the graduation of the scale. These reference marks are absolutely allocated to the graduation and are used to generate reproduceable control pulses. For the identification of each reference mark there is serially allocated to each reference mark a code mark which is made up of code mark segments. The code mark segments follow one upon the other without gaps in the measuring direction, and each includes a homogeneously continuous surface or zone. These code mark segments are arranged in correspondence to their coded information, offset parallel to one another transversely to the measuring direction and are scanned by a scanning field which is integrated in the scanning field used to scan the reference marks. This gapless arrangement of the code mark segments prevents interference with the scanning of the reference marks.


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