The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 1987

Filed:

Nov. 16, 1984
Applicant:
Inventors:

Koichi Haruna, Yokohama, JP;

Kazuo Nakao, Sagamihara, JP;

Tamotsu Nishiyama, Inashiro, JP;

Tsutomu Tashiro, Sagamihara, JP;

Kuniaki Matsumoto, Tokyo, JP;

Nobuyuki Saida, Yokohama, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364552 ; 364300 ;
Abstract

A reliability analyzing system for manufacturing processes is disclosed, which comprises a computer system provided with a data memory device, a central processing device and input/output devices, terminals which input/output information into/from said computer system, and output devices for manufacturing sites; whereby said data memory device stores required specifications for each product, works for manufacturing and controlling processes, information relating to items, such as required specifications, works, control items, etc. and information mutually relating different items, and on the basis of the stored information, reliability analysis for each process is effected for all the processes and reliability analysis for each required specification is performed for all the required specifications.


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