The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 1987

Filed:

Aug. 27, 1984
Applicant:
Inventors:

Hisashi Kuga, Nagareyama, JP;

Chikara Sasaki, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; B07C / ;
U.S. Cl.
CPC ...
2502 / ; 209536 ; 356237 ; 356448 ;
Abstract

A novel apparatus is provided for inspecting defects in cigarette bundles layered in buckets which are fixed to a bucket conveyor. The defects include tip fall state where the top content of cigarette piece is dropped off, loss of filter and shortage in the number of cigarette pieces. The apparatus consists of a gate time measuring device, a dark time measuring device, a computing device and a comparison device. The gate time measuring device measures gate time showing the passing time of the internal length of buckets, and the dark time measuring device measures dark time showing the passing time of a defective part of cigarette and of spaces between cigarette pieces. The computing device selects the maximum value of the dark time and computes a percentage of the gate time to the maximum value. The comparison device then compares the computed value with a predetermined value so as to determine whether or not there are defects in cigarette piece bundles.


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