The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 1987

Filed:

Jul. 24, 1985
Applicant:
Inventors:

Rokusaburo Kaneko, Kaisei, JP;

Yuji Takenaka, Kaisei, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B / ; G03B / ;
U.S. Cl.
CPC ...
355 56 ;
Abstract

Photographic printers are provided with a plurality of lenses with different magnifications. In order to change the size of the enlargement (or magnification of the enlargement), it is necessary for an operator to manually replace a lens or to select a suitable lens from among the plural lenses on a revolving lens turret by pressing a selector button. An exposure correction method is provided for a printer system in which lens units are selected such that when a lens unit is selected from among plural lens units having different focal lengths in accordance with a designated magnification, a conjugate length is calculated on the basis of the magnification and the focal length of the lens unit so as to select an optimum lens unit falling within the effective range of the system, and that the exposure is corrected on the basis of the relationship:


Find Patent Forward Citations

Kaneko, Rokusaburo. (1987). Exposure correction method (U.S. Patent No. 4643562). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4643562

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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