The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 1987
Filed:
Apr. 18, 1985
Peter F Aemmer, Wettswil, CH;
Kurt Aeppli, Uster, CH;
Zellweger Uster, Ltd., Uster, CH;
Abstract
The length of fabric is scanned continuously directly at the weaving machine and any defective variations from the texture judged to be normal are determined and displayed. Scanning is performed by an electrical-optical scanning head traversing across the width of the cloth and in the evaluation of the signals of the scanning head those signals are preferentially treated which represent an excessive variation from a specified size or number, or which have a certain periodicity. The variations of the type mentioned are representative of warp stripes and weft bars and consequently are very serious cloth faults. These cloth faults can now by means of scanning be detected directly at the weaving machine sufficiently early for corrective action to be taken in the weaving process before large quantities of fabric are produced with these faults. Thereby the occurrence of fabric of inferior quality is at least considerably reduced.