The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 1987

Filed:

Dec. 06, 1985
Applicant:
Inventors:

Haruo Ichikawa, Gyooda, JP;

Fumio Chida, Kitaadachi, JP;

Katsumi Akiike, Fukiage, JP;

Kanichi Izumi, Kitasaitama, JP;

Assignee:

Fuji Electric Co., Ltd., Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01H / ; H01H / ;
U.S. Cl.
CPC ...
337 82 ; 337 57 ; 335 45 ;
Abstract

A thermal overload relay of the type which uses a shifter to transmit thermal bending of the main bimetallic element to one end of the temperature compensating bimetallic element which is connected to a release lever which controls the closing of the relay and which includes an adjusting link which has an eccentric stem whose degree of rotation controls the setting of the release lever. As a calibration control to correct for unintended manufacturing variations and aging effects, the adjusting link supports an adjustment pin with an eccentric stem which abuts the eccentric stem of the adjusting dial to provide further control of the setting of the release lever.


Find Patent Forward Citations

Ichikawa, Haruo. (1987). Adjusting device for thermal overload relay (U.S. Patent No. 4642598). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4642598

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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