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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 4642461 B1

PDFFull Text
Date of Patent:
Feb. 10, 1987

Filed:

Nov. 29, 1984

Field emission type electron microscope using a multi-stage acceleration

Applicant:
Inventors:

Junji Endo, Kokubunji, JP;

Akira Tonomura, Koganei, JP;

Susumu Ozasa, Kashiwa, JP;

Tsuyoshi Matsuda, Tokyo, JP;

Chikara Kimura, Katsuta, JP;

Nobuyuki Osakabe, Kokubunji, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:

Antonelli, Terry & Wands

Primary Examiner:

Bruce C Anderson

Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250311 ; 3133631 ;
Abstract

A field emission type electron microscope using a multi-stage acceleration tube wherein an acceleration voltage to be applied to at least one, always inclusive of a first-stage acceleration electrode, of acceleration electrodes is changed in interlocked relationship with a change in a field emission voltage to be applied to a field emission electrode, so that power of an electrostatic lens can be kept constant.

Find Patent Forward Citations

Endo, Junji. (1987). Field emission type electron microscope using a multi-stage acceleration (U.S. Patent No. 4642461). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4642461

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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