Apparatus and method for failure testing of a control turn-off

Abstract

A scheme for determining the operational state of a control turn-off semiconductor, of the type having an anode, a cathode and control electrode to which signals are applied to control the conductive state of the semiconductor, utilizes the extant voltage at the control electrode to determine the actual conductive state of the semiconductor. A first signal representing the desired operational state of the semiconductor and a second signal representing the actual operation of the state of the semiconductor and appropriately combined in one embodiment to generate an indication of the operational state of the control turn-off semiconductor. A further embodiment, employed in a series connection of two such control turn-off semiconductors beteen dc buses, uses the second signals in a cross-coupled arrangement between the two semiconductors to inhibit the application of control signals to a first semiconductor if the second semiconductor is conductive. In a still further embodiment, the cross-coupled system just described is further combined with an anode sensing system to provide an improved, more positive system of preventing the dc short by providing the anode system sensing output system as a further input to the combination of the cross-coupled second signal and signal representing desired conduction. In an additional modification a latch function serves, in the cross-coupled embodiments, to render the cross-coupling inhibiting ineffective, once a semiconductor has been rendered conductive, for the commanded period of conduction.