The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 1987
Filed:
Jul. 05, 1983
Takahide Sakamoto, Hyogo, JP;
Tatsuo Hiroshima, Hyogo, JP;
Noriyuki Matsubara, Konomimachi, JP;
Kenichi Miyata, Konomimachi, JP;
Sumitomo Metal Industries, Ltd., Osaka, JP;
Abstract
A flaw detection apparatus for detecting flaws at the outer surface of a product, such as a steel bar, wire or steel pipe, which is round in section and produced by the hot rolling, by use of a probe of non-contact type and rotating around the product to be inspected, the apparatus providing a means for suppressing vibrations of an object to be inspected, a means for measuring a distance (lift-off) between the object to be inspected and the probe, and a means for carrying out positional control on the basis of the detection result of the lift-off measurement so that the axis of rotation of probe is allowed to be coincident with the axis of object to be inspected. In a case of using the eddy current inspection for the flaw detection, two coils of standard comparison system are used and a mixed signal of a plurality of frequencies is applied to the coils so that a signal obtained by the probe coils suppresses the signal component caused by the lift-off variation and corrects the flaw signal caused by existence of the signal component, thereby eliminating the influence of lift-off variation and enabling measurement with high accuracy.