The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 1987

Filed:

Dec. 29, 1983
Applicant:
Inventor:

Richard Schmidt, Huntington, NY (US);

Assignee:

Robotic Vision Systems, Inc., Hauppauge, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356376 ;
Abstract

A pattern of light is projected upon a surface to be measured which may be devoid of surface detail. A sharply focused image of the surface provides distance discrimination. Although the projected pattern may be separate from the imaging optics, a common optics path removes distortion, provides maximum sensitivity and eliminates processing for misalignment between projector and imager. Parallel detection of regions within the image receiving light intensities above a threshold enables rapid availability of measurements. Optical cross-correlation and Fourier transform processing methods may be employed to enhance image processing with no processing delay. Three-dimensional co-ordinate measurements relative to the sensor are reported for all in-focus regions of the image. Refocusing the lens provides depth coverage.


Find Patent Forward Citations

Loading…