The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 1987

Filed:

Jul. 26, 1985
Applicant:
Inventors:

Yoichi Iba, Tokyo, JP;

Tadashi Kimura, Tokyo, JP;

Kazuo Kajitani, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350414 ; 350515 ;
Abstract

An objective to be used with a single-objective type binocular stereomicroscope which comprises an objective for forming an afocal image, and two observation optical systems for observing the afocal image by the right and left eyes, the objective being arranged to fulfill the condition shown below so as to thereby prevent the error in the sense of depth and distance from occurring. ##EQU1##


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