The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 1987

Filed:

Jan. 15, 1985
Applicant:
Inventors:

John H Flora, Lynchburg, VA (US);

Thomas Powers, Jr, Lynchburg, VA (US);

Assignee:

The Babcock & Wilcox Company, New Orleans, LA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73602 ; 73620 ; 73628 ;
Abstract

An ultrasonic testing method and apparatus stores the reflected ultrasonic signals from each of a plurality of locations along a scan path over a piece of material to be tested. For each individual location, the reflected signal at that location is added to contributing signals from each other location to produce a composite signal which has a good signal-to-noise ratio. The contributing signals from each other location is formed by multiplying the signal of those other locations by a corrective phase shift factor which is a characteristic of a time delay for a reflected signal from the other locations to the individual location of interest. The contributing signal from each other location thus represents a rotated reflected signal from the other locations.


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