The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 1987
Filed:
Jul. 03, 1984
Applicant:
Inventors:
Assignee:
The State of Israel, , IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
3561245 ;
Abstract
A system and method for determining modulation transfer function (MTF) of an optical element or system employs a moire deflectometer. A selected central portion of monochromatic light is directed to the first grating of the moire deflectometer through or from the optical system, resulting in a moire pattern in which the contrast along an axis incident to the moire fringes is indicative of the MTF of the optical system for a particular spatial frequency, which is dependent on the spacing between the gratings of the moire deflectometer.