The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 1987

Filed:

Jun. 27, 1985
Applicant:
Inventors:

Kazuyoshi Koike, Otake, JP;

Yasuteru Tahara, Otake, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356 731 ; 356244 ;
Abstract

Provided is an apparatus for inspecting an optical fiber assembly through measuring irregularities in transmission loss of optical fibers which constitute said optical fiber assembly. The apparatus includes a base, a first slider block slidably laid on the base, means attached to the first slider block and adapted to grip both ends of the optical fiber assembly, a feed mechanism for feeding the first slider block by sliding the same on the base, a frame member secured to the base, a second slider block carried by the frame member, a light projector carried by the second slider block and adapted to irradiate a light beam onto the light receiving end of one of the optical fibers, a light receiver for receiving a light beam from the light emitting end of the one of the optical fibers and a light stop disposed in the light projector and adapted to stop the light beam irradiated by the light projector so that the light beam may be irradiated, exclusively, onto the light receiving end of only one of the optical fiber and within the same.


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