The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 1987

Filed:

Dec. 12, 1984
Applicant:
Inventors:

Tetsuo Kimura, Tokyo, JP;

Seiichi Tanaka, Chiba, JP;

Takasi Suzuki, Tokyo, JP;

Assignee:

Nittan Co., Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B / ; G08B / ;
U.S. Cl.
CPC ...
340500 ; 340511 ; 340628 ; 340632 ; 340630 ; 340661 ; 34087016 ; 250565 ;
Abstract

An environmental abnormality detecting apparatus for detecting abnormality in atmosphere such as heat, smoke, and a gas. A sampling circuit is provided for periodically sampling analog signals from a detector for detecting these phenomena. A quantizer quantizes sampled signals with step levels. An accumulator having a plurality of counters provides different accumulation times corresponding to the step levels. Reliability in accumulation effect is not degraded, and an abnormality signal can be detected in a short period of time when a degree of abnormality is high.


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