The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 1987
Filed:
Feb. 07, 1985
Applicant:
Inventors:
Clifford G Walker, Huntsville, AL (US);
George A Tanton, Huntsville, AL (US);
Assignee:
The United States of America as represented by the Secretary of the Army, Washington, DC (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356367 ; 356239 ;
Abstract
A wafer is positioned in a magnetic field. A computer initializes the light level and the electronic gain of each detector preamp associated with a fiber optic link from the analyzer. The magnetic field direction would then be reversed by computer command. This would cause a localized change in intensity of light passing through the wafer, due to Faraday Rotation (FR). The resulting change in detector output together with location and wavelength data could be used to compute a map of the wafer.