The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 1987
Filed:
Dec. 19, 1983
Applicant:
Inventors:
Richard H Howell, Melbourne, FL (US);
Alan J MacGovern, Acton, MA (US);
Assignee:
Itek Corporation, Lexington, MA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356353 ; 356354 ;
Abstract
An improved shearing interferometer is provided having an acousto-optic cell wherein two sets of orthogonal diffraction gratings are formed therein by applying two electrical signals thereto having different frequencies. A wavefront to be examined is passed through the cell, and both signal frequencies applied to the cell are varied to cause the resulting shearing interferogram to be sequentially directed at a pair of orthogonal linear photodetector arrays. The degree of shear may be readily adjusted by changing the difference between the frequencies of the two signals applied to the cell.