The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 1987
Filed:
Jul. 23, 1985
Applicant:
Inventor:
Vance C Mitchell, Irvine, CA (US);
Assignee:
ICL Scientific Corp., Fountain Valley, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G02B / ;
U.S. Cl.
CPC ...
350536 ;
Abstract
A microscope inspection slide including at least one examination chamber formed by bonding together a base plate and a cover plate. The base plate having a chamber floor surface raised above a deck surface on the base plate, and the cover plate having a roof surface with a depth control ridge positioned about a portion of the edge of the chamber roof surface. Bonding the cover plate to the base plate forms an examination chamber with the distance between the roof surface and floor surface maintained constant, and entrapped gases and excess fluid allowed to drain from the examination chamber through notches in the depth control ridge.