The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 1987
Filed:
May. 25, 1984
Peter J Taylor, Cambridge, GB;
PA Consulting Services Limited, London, GB;
Abstract
A pattern recognition system which produces from any object a diffraction pattern-typically an optical Fourier transform of the object, on a high resolution detector. Different points in the detector can be addressed by a scanning device to produce an electrical signal which can be digitized if required before being processed and compared with reference signals in a processor. A reduction in the formation to be scanned and pattern matched is obtained by using an optical Fourier transform or the like of the original object. A further reduction in the information needed to classify each of a known group of objects is obtained by a method which involves the presentation of each of the group members to the apparatus, the computation from each scanning of a discriminant function by multivariate analysis of the signal produced by the scanning and the use of the discriminant function to determine the points in the scanning of subsequent unknown members of the group which are required (and the weighting to be attributed to the signal at each such point) to allow for the reliable classification of each such unknown member of the group.