The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 1987

Filed:

Sep. 19, 1985
Applicant:
Inventors:

Tsuneyuki Egami, Gamagori, JP;

Tsutomu Saito, Okazaki, JP;

Mitosi Ando, Nishio, JP;

Ryuzou Hori, Toyota, JP;

Takashi Kamo, Toyota, JP;

Kazunori Yoshida, Okazaki, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
250571 ; 250566 ;
Abstract

A coating quality measuring device has a pattern plate including one reference pattern portion having a larger pattern width and a plurality of strip pattern portions having different pattern widths which are smaller than that of the reference pattern portion and are decreased in order. The pattern plate is disposed opposite the coated surface. The pattern plate is reflected on the coated surface and a reflected image is formed on an image sensor. The image sensor successively outputs signals each corresponding to the lightness of each pattern portion on a line extending in a width direction of each pattern portion of the reflected image. A computing device calculates a difference between the peak value of the signal level of the output signal corresponding to each strip pattern portion in the reflected image and the signal level of the output signal corresponding to the ground portion, divides the calculated difference by the signal level of the output signal corresponding to the reference pattern portion and detects the pattern width of the strip pattern portion wherein the division value becomes not larger than a predetermined value, thereby to obtain the coating quality of the coated surface.


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