The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 1987
Filed:
Jun. 26, 1985
Floyd E Anderson, Round Rock, TX (US);
Liang-Tsai Lin, San Diego, CA (US);
Motorola, Inc., Schaumburg, IL (US);
Abstract
An on chip test system for arrays is provided that includes self test and maintenance operation while allowing for both synchronous and pipeline modes of normal operation. The system is integrated on a chip that includes a plurality of inputs and a plurality of outputs. A plurality of gates are coupled between the plurality of inputs and outputs wherein input signals may be transmitted asynchronously to the gates and output signals may be transmitted asynchronously to the outputs. An input shift register is coupled between each of the inputs and the gates for synchronously transmitting input signals, and an output shift register is coupled between the gates and each of the outputs for synchronously transmitting output signals. A control logic circuit is coupled to the plurality of gates, the input shift registers, and the output shift registers for selecting the systems mode of operation. A comparator circuit is coupled to the output shift registers for comparing said output signals with expected signals.