The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 1987
Filed:
Dec. 27, 1982
James E Lenz, Brooklyn Park, MN (US);
Gordon L Mitchell, New Brighton, MN (US);
Honeywell Inc., Minneapolis, MN (US);
Abstract
A method of mapping at least a portion of a magnetic field with an interferometer is presented. The interferometer includes an optical fiber clad with a magnetostrictive material. The approximate direction of the magnetic field lines are determined and the optical fiber is placed substantially transverse to the magnetic field lines. The output of the interferometer is recorded for various positions of the optical fiber. The fiber can be maintained substantially transverse to the magnetic field lines during mapping, or the fiber can be positioned substantially transverse to the field lines to precisely determine the direction of field lines and substantially parallel to the field lines to determine field magnitude. In one embodiment the interferometer is adapted to produce a null output for a predetermined value of the integral of the magnetic field along the length of the optical fiber, and the optical fiber is of uniform construction. In this embodiment, the loci of reference points corresponding to null outputs provides a mapping of points of symmetry in the magnetic field. The direction of magnetic field lines at a point in space is also determined by seeking the minimum output of the interferometer by scanning about the point with the optical fiber.