The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 1987
Filed:
Sep. 21, 1983
Clarence D Lunden, Federal Way, WA (US);
The Boeing Company, Seattle, WA (US);
Abstract
Method and apparatus for the nondestructive testing of metal-clad microwave circuit boards to determine dielectric constant variations within the dielectric sheets of such boards. The method involves using injected microwave energy to measure values related to the average dielectric constant along a plurality of paths in the plane of the sheet. The paths are divided into two intersecting groups, with each path being parallel to the members of its own group. Resulting values are then compared in order to identify dielectric constant variations within the sheet. Measurements may be made by means of phase delay or amplitude/resonance frequency techniques. A preferred apparatus for phase delay measurement is disclosed which includes means for making a simultaneous phase delay measurement along a reference air path.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile