The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 1987
Filed:
Dec. 17, 1984
Thomas J DeLacy, Los Altos, CA (US);
Ford Aerospace & Communications Corporation, Detroit, MI (US);
Abstract
Non-invasive and non-destructive apparatus and method for imaging, recording, and comparing the mass density distributions and thicknesses of test specimens (19F, 19B). A source of medium-to-high-energy photons (3) directs a photon beam (4) at an electron source (17) comprised of high atomic number material, which emits in response thereto electrons (9F, 9B), some of which are not absorbed and not widely scattered by the test specimens (19F, 19B), but are transmitted therethrough and captured on one or more photographic films (15F, 15B) in contact with said specimens (19F, 19B). Net recorded film (15F, 15B) densities are in inverse relation to the mass density distribution of the corresponding test specimen (19F, 19B). A filter (5) is interposed between the photon source (3) and the capture film (15B) when back emission imaging (B) is employed. The filter (5) is optional when forward emission imaging (F) is used. The filter (5) absorbs photons (4) that have an energy sufficiently low to create an unwanted X-ray response on the capture film (15F, 15B) within the period required for the desired electron (9F, 9B) imaging.