The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 1987
Filed:
Jun. 08, 1984
Ronald K Farleman, Reminderville, OH (US);
Charles W Fetheroff, Willowick, OH (US);
Istvan M Matay, North Royalton, OH (US);
TRW Inc., Cleveland, OH (US);
Abstract
A method is provided to inspect a resiliently deflectable O-ring which tends to distort under the influence of its own weight. The O-ring is placed on a transparent support member with the central axis of the O-ring in a vertical orientation. Light is directed toward the O-ring and through the support member to cause the O-ring to cast a shadow. The distance between portions of the shadow cast by diametrically spaced apart portions of the O-ring indicate diametral measurements of the O-ring. The distance between radial edge portions of the shadow cast by the O-ring indicates the thickness of the O-ring. To detect surface flaws in the O-ring, light is directed against a small area on the surface of the O-ring while it is rotated. A variation in the characteristics of the reflected light indicates the presence of a flaw in the surface of the O-ring. To provide for scanning of inner and outer surface areas of the O-ring to detect surface flaws, the O-ring may be rotated about an axis which extends perpendicular to the central axis of the O-ring and is tangential to a circle through the center of the cross section of the O-ring.