The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 1986
Filed:
Jul. 23, 1985
Applicant:
Inventor:
Alan Ferber, Hillside, IL (US);
Assignee:
The Perkin-Elmer Corporation, Norwalk, CT (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250216 ; 356326 ;
Abstract
Wavelength related interference artifacts may appear superimposed on the output data curve of a scanning spectrophotometer utilizing a photodiode array as photometric detector. These may be suppressed by interposing a transparent optical element in the optical beam adjacent to its incidence on the array. Such an element should have no optical power along an axis parallel to the wavelength axis of the array and should provide varying phase displacement of the rays of the beam transverse to the wavelength axis. Several forms such an optical element may take are disclosed.