The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 1986
Filed:
Apr. 15, 1985
Applicant:
Inventors:
Assignee:
Tokyo Kogaku Kikai Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ; G01N / ;
U.S. Cl.
CPC ...
351211 ; 351212 ; 356128 ; 356382 ;
Abstract
Method for determining a refractive index of an object in which the object is illuminated with a slit pattern of illumination light to form an optical section of the section of the object and the optical section is observed in two directions to determine apparent thickness of the optical section in these directions. Operations are carried out to obtain the refractive index of the object from the apparent thickness of the optical section.