The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 1986
Filed:
Nov. 03, 1983
Bruce R Kowalski, Seattle, WA (US);
Gilson H Rohrback, Seattle, WA (US);
Rohrback Technology Corporation, Seattle, WA (US);
Abstract
A method and apparatus for analyzing an unknown sample to produce information corresponding to individual components of the sample. The information may then be used to identify and quantify the components. The method of the present invention contemplates subjecting the sample to a plurality of separation processes to produce a corresponding plurality of distinct spatial distributions of the sample. The separation processes could include two or more chromatographic processes in which the stationary phases have different separating characteristics. For each distribution, a set of properties (sample set) is determined at a plurality of positions along that distribution. In one embodiment, the set of properties comprises the absorbance of electromagnetic radiation at a plurality of wavelengths. The sample sets for each process are analyzed to determine one or more basic sets capable of representing all the sample sets for that process. Basic sets common to all processes are taken to be estimates of the set of properties for individual components of the sample. Basic sets found for less than all processes are analyzed to determine whether they can be represented by linear combinations of common basic sets, or whether they can be represented as linear combinations of certain known basic sets and a new basic set. In a further embodiment of the invention, all of the sample sets along all of the distributions are analyzed to determine one or more common basic sets.