The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 1986
Filed:
Oct. 04, 1984
Edilberto I Salazar, Brookfield, CT (US);
Wallace Kirschner, Trumbull, CT (US);
John L Lorenzo, Southbury, CT (US);
Keith E Schubert, West Norwalk, CT (US);
Philip Pollak, Jr, Westport, CT (US);
Pitney Bowes Inc., Stamford, CT (US);
Abstract
An improvement in combination with a postage meter including a rotary drum having a periphery adapted for feeding a sheet in a path of travel. The improvement comprises: a first device for sensing a time interval during which a sheet is linearly displaced a predetermined distance in the path of travel; a d.c. motor coupled to the drum for rotation of the drum; a second device for sensing angular displacement of the drum; and a computer coupled to the first and second sensing devices and to the d.c. motor; wherein the computer responds to the first sensing device for providing respective amounts representative of desired angular displacements of the drum during successive sampling time periods, responds to the second sensing device for providing respective amounts representative of actual angular displacements of the drum during successive sampling time periods, compensates for the difference between desired and actual angular displacements and generates a d.c. motor control signal for controlling rotation of the motor to cause the linear displacement of the periphery of the drum to substantially match the linear displacement of the sheet during respective sampling time periods.