The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 1986

Filed:

Apr. 26, 1985
Applicant:
Inventor:

Gregory M Cutler, Mountain View, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03L / ;
U.S. Cl.
CPC ...
331-9 ; 331 23 ; 331 32 ; 372 26 ; 455611 ;
Abstract

A wavemeter/frequency locking technique suitable for indirectly locking an optical frequency f.sub.0 to a radio frequency f.sub.1 or for locking the radio frequency to the optical frequency. A beam of optical frequency f.sub.0 is phase modulated by a signal of average frequency f.sub.1 that is itself modulated at frequency f.sub.2. The modulated beam is passed through a filter to a detector to produce a detector output signal that has components at linear integral sums of f.sub.1 and f.sub.2. A pair of control signals are generated that are proportional to the amplitude of two of the components of the detector output signal. These control signals are separately used in a pair of servo loops to separately establish fixed values of f.sub.0 /f.sub.f and f.sub.1 /f.sub.f, where f.sub.f is a characteristic frequency of the filter. A method is presented for stepping the value of f.sub.0 /f.sub.f to another value and measuring f.sub.1 /f.sub.2 at each of these values, thereby enabling the value of f.sub.0 to be determined.


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