The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 1986

Filed:

Apr. 17, 1985
Applicant:
Inventors:

Horst Burkhardt, Truchtlaching, DE;

Alfons Ernst, Traunreut, DE;

Holmer Dangschat, Traunreut, DE;

Horst Wogatzke, Neuss, DE;

Assignee:

Johannes Heidenhain GmbH, Traunreut, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
2502 / ; 3312 / ; 2502 / ;
Abstract

A position measuring system includes for the determination of a reference position at least one additional reference scanning unit which is shiftable relative to the measuring scale, independently of the measuring scanning unit and the measuring scale, and accordingly of the machine components connected to the measuring scanning unit and the measuring scale. The measuring scale carries an incremental graduation and a reference mark, and the measuring scanning unit and the reference scanning unit carry indicator blocks which on coincidence form a zero indicator. In order to determine the reference position, the reference marks and the zero indicator are scanned successively, but in arbitrary sequence, and their differential spacing is determined with the aid of a graduation of the reference scanning unit.


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