The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 1986

Filed:

Nov. 15, 1984
Applicant:
Inventors:

Hisao Kitagawa, Hachioji, JP;

Yasuo Inoue, Hachioji, JP;

Tadafumi Fujihara, Hachioji, JP;

Itaru Endo, Hachioji, JP;

Yoshihiro Shimada, Hachioji, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05B / ; G02B / ;
U.S. Cl.
CPC ...
219200 ; 219201 ; 219385 ; 219521 ; 350533 ;
Abstract

A heater for microscopes for heating a sample and maintaining the sample, which is mounted on a platform of the microscope, at a preset temperature during observation of the sample. The heater includes a platform for supporting thereon a sample container and a heater for heating at least part of the platform. A first heater box is fitted, open end down, over the platform and is connected thereto to form a first space which surrounds the sample container. A second heater box is then fitted over the first heater box in such a manner that a second space which surrounds the first heater box is formed. Heater means are provided for heating the second space. Accordingly, the temperatures in the first space and in the second space can be controlled independently to achieve better control over the temperature of the sample which is to be observed and to control condensation which may otherwise form in the sample holding container.


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