The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 1986
Filed:
Jan. 14, 1985
Applicant:
Inventors:
Mark S Kirby, West Midlands, GB;
Robert J Hansman, Jr, Scituate, MA (US);
Assignee:
Massachusetts Institute of Technology, Cambridge, MA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73590 ; 340582 ;
Abstract
Method and apparatus for measurement of ice thickness employing ultra-sonic pulse echo technique, wherein an ultra-sonic pulse is emitted from a transducer at the ice-accreting surface of a structure, the pulse is reflected at the periphery of the accreted ice and the reflection is detected. The time delay is calibrated and related to ice thickness and accretion rate.
Kirby, Mark. (1986). Method and apparatus for measurement of ice thickness employing (U.S. Patent No. 4628736). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4628736
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile