The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 1986
Filed:
Apr. 05, 1983
Gerhard Huschelrath, Laufach-Frohnhofen, DE;
Ursula Ruth, Ronneburg, DE;
Nukem GmbH, Hanau, DE;
Abstract
A method and an apparatus for testing materials using the eddy current principle enables a better exploitation of the sensitivity of measurement. Initially, the complex values appearing during a test cycle are examined as to whether only disturbance signals, disturbance signals in connection with flaw signals, or only flaw signals are present. The complex values are selectively further processed directly if there are flaw signals only, or are further processed for disturbance signal elimination. The direct further processing as well as the further processing made after elimination of the disturbance signal comprises the determination of the type of flaw and the depth of the flaw.