The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 1986

Filed:

Apr. 08, 1985
Applicant:
Inventors:

Gustav C van Cauter, Batavia, IL (US);

Leroy J Everett, Glen Ellyn, IL (US);

Stanley J DeFilippis, Naperville, IL (US);

Assignee:

Packard Instrument Company, Inc., Downers Grove, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
2503 / ; 250364 ; 250328 ;
Abstract

Apparatus and a regionless method of ascertaining the activity of each radionuclide in a dual-label sample. A set of correlation curves is generated utilizing quench standards for both a low energy radionuclide and a high energy radionuclide. A test sample was then counted and the quench-indicating parameters for the test sample are compared with the quench-indicating parameters of the correlation curves to determine the appropriate contribution of each radionuclide to the overall energy spectra of the test sample. From this comparison the overall count rate for the test sample may be allocated between a low energy radionuclide and a high energy radionuclide. By dividing the count rates by efficiencies determined from another set of correlation curves the actual disintegration per minute (DPM) rate for each radionuclide may be ascertained.


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