The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 1986
Filed:
Nov. 15, 1983
Dietlind Gardell, Oxford Station, Ontario, K0G 1T0, CA;
Gail Rock, Rockcliffe Park, Ottawa, Ontario, K1L 5A2, CA;
Other;
Abstract
An automated system for rapid sequential photometric analysis of a collection of double fluorochrome stained lymphocyte specimens, useful for antibody screening or lymphocytotoxicity analysis. The specimens are sequentially alternately irradiated with light of two distinguishable wavelengths, producing fluorescence at two distinguishable wavelengths. The fluorescent emission light intensity for each irradiation of each specimen is measured using a photometer and computer. The computer controls the synchronization of the irradiation through alternately selected condenser sets with the sequential movement of specimens into the optical path of the irradiating and detected light, and calculates the quotient of the light intensities emitted from each specimen at the two selected fluorescent light wavelengths. These quotients are compared against a control ratio (for lymphocytotoxicity analysis) to classify the specimen. Also described is a method of preparing specimens for such analysis, which requires that a complement be added to the first staining solution after the latter is applied to the specimens, then this combination agitated, and then the second staining solution added and the specimen incubated.