The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 1986

Filed:

Sep. 03, 1985
Applicant:
Inventors:

James P Waters, Ellington, CT (US);

Mark R Fernald, Enfield, CT (US);

Assignee:

United Technologies Corporation, Hartford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356349 ; 356345 ; 356358 ;
Abstract

A common optical path interferometric gauge comprises an optical beam that is split into two beams. Both beams are modulated and recombined after introducing an optical path length difference greater than the coherence length of the optical source. The combined beam is guided along a common optical path and is subsequently split into reference and measurement beams. The measurement beam is guided along a measurement optical path that includes a moving workpiece surface. Both beams are recombined after interposing an optical path length difference therebetween so as to reestablish coherence between portions thereof, producing optical interference indicative of the surface movement.


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