The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 1986

Filed:

Apr. 11, 1985
Applicant:
Inventors:

William F Hahn, Philadelphia, PA (US);

Hirimie T McAdams, Clarence, NY (US);

Robert L Talley, Marilla, NY (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B02C / ; B02C / ;
U.S. Cl.
CPC ...
241 24 ; 241 76 ;
Abstract

Differential rate screening processes and apparatuses for continuously screening a feed of particulate material having particles distributed among a plurality of substreams each of a different size class. A stream of feed is separated by causing part of each of at least two undersize substreams to pass through the apertures of a screening member at partial flow rates providing control over the size distribution of a throughs stream. The relative flow rates at which the undersize substreams pass into the throughs stream is controlled to provide substantially a preselected size distribution in a particulate product stream.


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