The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 1986

Filed:

Jul. 19, 1985
Applicant:
Inventor:

David C Chu, Woodside, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01P / ;
U.S. Cl.
CPC ...
73-5 ;
Abstract

A method and apparatus is presented for calibrating instruments for time interval measurements, pulse width measurements, and rise and fall time measurements. The preferred method comprises generating two coherent pulses using a linear passive device. The coherent pulses are simultaneously a.c. coupled to two channels of, for example, a time-interval measuring instrument. The time interval between the coherent pulses passing through the instrument is measured at identical voltages on each signal. Then the coherent pulses are exchanged between the channels and a further interval measurement is made. The results of each of the measurements are compared and used to calculate calibration constants to correct systematic errors present in the instrument.


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