The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 1986
Filed:
Mar. 05, 1984
Willis E Golder, Holliston, MA (US);
Joseph A Ierardi, Norwood, MA (US);
Robert E Staples, Lakeville, MA (US);
Michael C Boyle, Norton, MA (US);
Pylon Company, North Attleboro, MA (US);
Abstract
A test fixture for selectively electrically connecting an electronic circuit device for in-circuit and functional testing by automatic testing equipment. First and second pluralities of spring-loaded probes are fastened to the test fixture for respectively providing an in-circuit contact array on a first level and a functional contact array on a second level. An electronic cicuit device receiving face is mounted to the test fixture for movement to the first level for electrically connecting the electronic circuit device to the in-circuit contact array, and for movement to the second level for electrically connecting the electronic circuit device to the functional contact array. Means including a bi-level vacuum controller are disclosed for selectively moving the electronic circuit device receiving face to the first and second levels. Means coupled to the bi-level vacuum controller are disclosed for venting the test fixture to ambient during transitions from higher to lower vacuum pressures and to the unactuated condition. The bi-level vacuum controller may be locally actuated by a system operator or remotely actuated by the automatic testing equipment.