The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 1986
Filed:
May. 14, 1984
Applicant:
Inventors:
John P Rahn, Canoga Park, CA (US);
C Denton Marrs, Ridgecrest, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356445 ; 356239 ; 356432 ; 356448 ;
Abstract
The total optical loss caused by laser induced damage to an optical component is measured by monitoring the phase shift during mirror reflectance or transmission. The phase shift is directly proportional to the amount of loss. A secondary laser illuminates the area under test with a coherent light beam well below the component's damage threshold. This reference beam is modulated. The reflected or transmitted reference beam is monitored by a photomultiplier tube whose output is fed to a lock-in circuit. The lock-in circuit compares the phase of the received light to the induced modulation.