The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 1986
Filed:
Nov. 05, 1984
Applicant:
Inventors:
Takashi Kurihara, Tokyo, JP;
Chikara Nagano, Tokyo, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
350414 ; 350465 ;
Abstract
An objective lens system for microscopes having a long working distance and aberrations favorably corrected to peripheral portion of visual field comprising a first meniscus lens component, a second positive lens component, a third cemented doublet consisting of a positive lens element and a nagative lens element, a fourth positive lens component and a fifth meniscus lens component.