The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 1986
Filed:
Dec. 14, 1982
Applicant:
Inventor:
Kazuo Imose, Takarazuka, JP;
Assignee:
Teijin Limited, Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356381 ;
Abstract
A beam of light generated by a light source is separately applied to a measured film having unknown thickness and a reference film having a known thickness. The light transmitted through the measured film and the reference film are converted into electric signals which are electrically processed by a logarithmic operation circuit so as to produce a specific electric signal proportional to the difference between the thickness of the measured film and the reference film.
Imose, Kazuo. (1986). Method and apparatus for measuring thickness of a film (U.S. Patent No. 4623254). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4623254
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile